Circuit Board Fault Detector

Overview of Circuit Board Fault Detector System:

    A multifunctional circuit board fault diagnosis system capable of providing professional-level testing and inspection for a full range of circuit boards. It consists of a hardware testing platform, a programmable software testing platform, and test fixtures (including fixtures and jigs). The hardware testing platform is composed of test units, which can be expanded according to testing requirements to enhance the system's testing functions and channels. The software testing platform allows test program programming through both code and non-code methods, enabling the archiving of all data and steps in the testing process. This forms a streamlined, standardized, and informatized testing procedure, achieving automated system software testing and improving the accuracy of fault detection and system testing efficiency.

I. BM8600 Circuit Board Fault Detector System Composition:

System Composition Overview:

1. System Hardware Testing Platform: (Each test unit can be expanded with additional test modules to meet required testing channels)

1) Multi-power Digital Integrated Circuit Test Unit (Digital Circuit Test Unit): Expandable: 2048 test channels;

2) Analog Integrated Circuit Test Unit (Analog Device Test Unit);

3) Multifunctional Instrument Unit (Eight-in-One Instrument Unit);

4) Three-Dimensional V-I-F Dynamic Impedance Test Unit (Dynamic Impedance Test Unit): Expandable: 2048 test channels;

5) Programmable Power Supply Unit: Power channels can be expanded as needed for testing;

6) Hardware Testing Framework;

2. Editable Software Testing Platform:

1) Non-code Programming: Test process management, forming a streamlined, standardized, and informatized testing procedure;

2) Code Programming: Automated and semi-automated full-board circuit board testing, enabling batch testing of circuit boards, production inspection testing, and consistency analysis testing.

3. Test Fixtures:

1) Test Fixtures: Fixtures required for daily manual testing;

2) Jigs: Specialized test tooling for full-board circuit board testing (customized: including needle beds, dedicated interface boards, etc.).

(I) Functions of the BM8600 Circuit Board Fault Detector System Hardware Testing Platform:

1. Multi-power Digital Integrated Circuit Test Unit (Digital Circuit Test Unit): Expandable: 2048 test channels; Unit consists of ABI-6500 modules *2.

1) 128 channels (expandable to 2048 channels);

2) Digital device functional testing, pin voltage, pin connection status, temperature inflection point coefficient, digital V-I testing;

3) Advanced logic timing generator;

4) Advanced circuit board fault location function;

5) Short-circuit tracing (continuity measurement);

6) Identification of unknown device models.

2. Analog Integrated Circuit Test Unit (Analog Device Test Unit); Unit consists of ABI-2500 module *1.

1) Analog device V-I curve testing, matrix testing;

2) 24 test channels, 2 probe test channels, 2 synchronous pulse output channels, 3 discrete device test channels;

3) V-I, V-T, I-T curve testing for various devices;

4) Analog integrated circuit and discrete device testing functions.

3. Three-Dimensional V-I-F Dynamic Impedance Test Unit (Dynamic Impedance Test Unit): Expandable: 2048 test channels; Unit consists of ABI-3400 module *1.

1) Specifications: 64 test channels + 4 probe test channels + 4 sets of synchronous pulses, switchable to 32+32 channel test mode;

2) Provides: V-I-F, V-T-F, V-I, V-T curve testing;

3) Matrix testing: V-I (impedance) curve testing between all pins;

4) Displays electrical parameter values (V/I) at each point on the curve in a two-dimensional graph: specific voltage and current values;

5) The device can be expanded in steps of 64 channels up to 2048 test channels.

4. Multifunctional Instrument Unit (Eight-in-One Instrument Unit); Unit consists of ABI-6350 module *1.

Specifications: Integrates 8 commonly used test instruments into one unit;

1) 3-channel digital oscilloscope;

2) 2-channel arbitrary waveform generator;

3) 2-channel digital voltmeter;

4) 1-channel digital ammeter;

5) 1-channel digital ohmmeter;

6) 1-channel frequency counter;

7) 8-channel general-purpose I/O interface;

8) 4 fixed output power supplies.

5. Programmable Power Supply Unit; Unit consists of ABI-1200 module *1.

1) Specifications: Three adjustable outputs, capable of series/parallel connection;

2) Channels are fully isolated;

3) Each channel provides 0～±40VDC, 8Amax, 40Wmax;

4) Equipped with overvoltage and overcurrent protection;

5) Remote voltage monitoring compensation function.

6. Hardware Testing Framework: UK-origin 19-inch rack-mounted unit including computer (can install six modules).

(II) Functions of the Programmable Software Testing Platform:

Chinese and English software, capable of operating and controlling all modules through programming software.

1. Features test process memory function (software has powerful test process editing and recording capabilities);

2. Test process design runs through the entire testing procedure, forming standardized test processes (maintenance process, production process, testing process). All steps and data of the process test can be saved according to testing requirements, forming a standardized test process. This ensures consistency in testing procedures, eliminating human factor interference, making testing simple, easy, standardized, and procedural.

3. Comprehensive recording of various test information. The software can store measured pin voltages, connection relationships, functional test results, and V-I and V-T curves into the test process, facilitating comparison with other circuit boards at any time, greatly simplifying repetitive comparison work during testing.

4. The software allows users to add text descriptions, photos, Office Word, Office Excel, PDF documents, web links, etc., to test steps, significantly improving testing efficiency.

5. Graphical test library editor, graphically defining input stimulus signals and standard response signals for test record output, quickly establishing component and circuit board test libraries. Expanding component and full-board test libraries is simple and fast. Non-professionals can quickly expand the test library.

6. *Test data recording and generation of custom inspection reports. System test data can be customized to generate custom test reports as needed. Test reports can include test data and results of interest to the user. Generating user-specific test reports facilitates the preservation of test data.

7. *Chinese and English test operation software, Chinese software fully localized to all menu levels (complete Chinese version), providing free lifetime software upgrade services;

8. Intelligent programming, through the TFL editor, each test step can be programmed. The TFL editor includes 21 programming commands such as WHILE, IF, STARTLOGDB, WRITELOGDB, SYSTEM, etc.

(III) Functions of Test Fixtures:

1. Test fixture accessories, including: One set of various device test fixtures such as DIL (fixtures required for daily manual testing);

2. Jigs require customization services: Specialized test tooling for full-board circuit board testing (including: needle beds, dedicated interface boards, etc.);

3. Optional accessories: SOIC test fixtures, offline test boxes, discrete device test probe sets, etc.

II. BM-8600 Circuit Board Fault Detector System Features:

1. *Modular design of the hardware system, allowing expansion of test modules and test channels as required.

2. *Software system test process streamlined design, enabling process-oriented testing without programming: saving all steps and data of the process test to form a standardized test process. Subsequent tests will

3. Follow the process steps to conduct tests, obtain corresponding results, and generate data comparison reports. The test process design runs through the entire testing procedure, continuously improving the test process. Real-time integration of testing experience and information into the test process technology. Circuit boards with process-oriented design enable rapid manual, semi-automated fault detection and board-level system testing, improving fault detection and testing efficiency.

4. *Test data recording and generation of custom inspection reports. System test data can be customized to generate custom test reports as needed. Test reports include test data and results of interest to the user. Generating user-specific test reports facilitates the preservation of test data.

5. *Multi-power digital circuit test module features 64-channel digital integrated circuit online/offline functional testing (expandable to 2048 channels). Each channel can be independently defined as: input/voltage measurement, output/signal drive, or V/I curve measurement; enabling custom testing, device and full-board custom simulation testing.

6. *Features threshold level critical point scanning test function, determining standard board level critical values, allowing inspection of fault board device stability.

7. The system can perform port testing on various devices: V-I, V-T, V-I-F testing. Two-dimensional V-I testing frequency as low as 1Hz, three-dimensional testing frequency up to 10kHz, very suitable for testing inductors and high-frequency capacitor devices. Synchronous pulse signal amplitude and width can be set for functional testing of thyristor components or FETs.

8. Variable frequency three-dimensional V-I-F measurement method, three-dimensional display of device port characteristic curves, enabling detection of frequency-related faults. Inspection of devices or circuit boards related to frequency characteristics, three-dimensional graphic measurement method, suitable for digital and analog integrated circuits and circuit board testing.

9. *All system modules operate simultaneously under the same professional platform control, completing streamlined, step-by-step, standardized testing and generating custom test reports.

10. *Integrates 8 test instruments into one: 3-channel digital oscilloscope, 2-channel arbitrary waveform generator, 2-channel digital voltmeter, 1-channel digital ammeter, 1-channel digital ohmmeter, 1-channel frequency counter, 8-channel general-purpose I/O interface, 4 auxiliary power supplies. 8 conventional test instruments can operate concurrently, all steps can be recorded and compared, all test data can be quantified, and test reports can be generated. Enables simulation testing, debugging testing, consistency testing, and other full-board tests for circuit boards.

11. Programmable power supply module features 3-channel isolated power output, power output controlled by system software. The three channels can support series/parallel connections to increase voltage and current output range. The power supply module can automatically turn on and off the power required for testing according to process design. Used in conjunction with other modules, the power supply enables automation of full-board testing and multi-power testing processes.

12. Extensive digital device test library with over ten thousand types, covering commonly used devices. The test device library can also be quickly expanded and customized through the graphical device editor. Input stimulus signals and standard response signals for test output can be defined via the graphical device editor, enabling rapid batch establishment of component and full-board test libraries.

13. The system includes an analog device test library, capable of functional testing for amplifiers, comparators, diodes, transistors, thyristors, FETs, optocouplers, AD and DA analog-to-digital conversion devices, and other analog integrated circuits. Speed functional testing for optocouplers and relay components, etc.

14. The system can perform port testing on various devices: V-I, V-T, I-T testing. Testing frequency up to 12kHz, very suitable for testing inductors and high-frequency capacitor devices. Synchronous pulse signal amplitude and width can be set for functional testing of thyristor components or FETs.

III. BM8600 Circuit Board Fault Detector System Unit Module Features:

1. Advanced Test Module for Multi-power Digital Integrated Circuit Testing (ABI-6500)

    This module has 64 measurement channels, providing multiple measurement functions. These channels offer comprehensive fault diagnosis capabilities, including digital integrated circuit functional testing (online/offline testing), measurement of integrated circuit pin connection status and voltage values, and V-I curve testing function used without power application. It is an advanced test module for digital integrated circuit testing. The system provides more comprehensive and accurate information, with richer testing conditions. Simulation test input voltage can be customized between -10V and +10V as needed, and detection output level thresholds can also be customized. The ABI-6500 module can better detect components outside the test library, making circuit board simulation testing more convenient and faster.

2. Analog Circuit Test Function Module (ABI-2500)

    The analog integrated circuit test module allows functional testing of analog integrated circuits and discrete devices. All common analog integrated circuits can be tested. The system performs functional testing based on the circuit configuration of the integrated circuit on the PCB, without the need for programming or reference to circuit diagrams. This module also includes complete V-I curve testing functionality. Circuit boards or integrated circuits can obtain clear and understandable graphical test results without power application. The ABI-2500 module includes a standard analog device parameter test library.

3. Three-Dimensional Matrix V-I-F Dynamic Impedance Hybrid Circuit Test Module (ABI-3400)

    Specifications: 64 channels, three-dimensional V-I-F testing, suitable for detecting frequency-related device characteristics. Powerful matrix testing, expandable test channels (expandable in steps of 64 channels, up to 2048 channels). Unique synchronous pulse test mode, enabling the creation of standard test processes and steps.

4. Eight-in-One Multifunctional Instrument Module (ABI-6350)

    The eight-in-one multifunctional instrument module provides multiple high-specification test and measurement instrument functions in a single module. This design is suitable for educational and general-purpose electronic measurements. The module offers eight common instrument functions: 3-channel digital oscilloscope, 2-channel arbitrary waveform generator, 2-channel digital voltmeter, 1-channel digital ammeter, 1-channel digital ohmmeter, 4-channel frequency counter, 8-channel general-purpose I/O interface, 4 auxiliary power supplies. Operators can use the software's custom instrument platform function to design customized instrument operation interfaces.

5. System-specific Adjustable Power Supply Module (ABI-1200)

    This module provides the necessary power for integrated circuits or circuit boards during testing. It features three groups of adjustable isolated power outputs, with three channels supporting series/parallel connections, remote voltage monitoring compensation, and overvoltage and overcurrent protection functions.

IV. BM8600 Circuit Board Fault Detector System Unit Module Main Technical Specifications:

1. Multi-power Digital Integrated Circuit Test Module: (6500 module *1)

1.1 Number of test channels: 64 test channels (expandable to 2048 channels)

1.2 Digital V-I curve testing function, 64 test channels (expandable to 2048 channels)

1.3 Bus isolation signal channels: 8 channels (4 logic high + 4 logic low)

1.4 Configurable output logic signal level range: -10V to +10VDC

1.5 Automatic scanning function for current working digital logic level thresholds

1.6 Logic timing generator: 64 channels (expandable to 2048 channels), 999 patterns per channel

1.7 64 channels can be independently defined as: input (measurement) and output (drive), output signal range: -10V to +10V, input signal range: +20V to -20VDC

2. Analog Circuit Test Module: (2500 module)

2.1 V-I Testing Performance

Measurement channels: 2 probe channels, 2 synchronous pulse signal channels, 24 test fixture channels, 3 discrete device test channels;

V-I curve test scanning voltage range: 2～50Vp-p;

V-I curve test scanning frequency range: 37.5Hz～12kHz;

V-I curve test impedance range: 100Ω～1MΩ;

V-I curve test signal waveform: sine wave, triangle wave, ramp wave;

Display curve modes: V-I, V-T, I-T;

Testing methods: learn and compare, probe real-time comparison, matrix testing;

Synchronous pulse signal amplitude: -10V～+10V;

Synchronous pulse output modes: positive pulse, negative pulse, bidirectional pulse, DC;

2.2 Analog Integrated Circuit and Discrete Component Testing Function

Number of measurement channels: 24 independent test channels;

Drive output voltage: -12V～+12V;

Drive output current: 200mA;

Measurable input voltage: ±24V;

IC test package types: OP amplifiers, comparators, DACs, ADCs;

IC testing method: online testing, if OPA operates in linear region, amplification factor (Av) can be automatically calculated;

Transistor testing capability: transistors, FETs, TRIACs, THYRISTOR;

3. System-specific Adjustable Power Supply Module Function: (1200 module)

Power supply output control can be manually switched via software;

3 channels completely independent;

Each channel: 0～40VDC max, 0～8A max, 40W max;

Supports series/parallel connection to increase voltage and current supply;

4. Eight-in-One Multifunctional Instrument Module Performance: (6350 module)

 4.1 Digital Storage Oscilloscope

Test channels: 3 test channels;

Bandwidth: 100MHz;

Sampling rate: 500MS/s (25GS/s ERS mode);

Input impedance: 1MΩ;

4.2 Function Signal Generator:

Test channels: 2 channels;

Output waveforms: DC, sine wave, square wave, triangle wave, positive pulse, negative pulse;

Output frequency range: 0.5Hz～25MHz;

Output impedance: 50Ω;

4.3 General Purpose I/O:

Number of channels: 8 general-purpose I/O channels;

Channel modes: voltage output, voltage input;

Provides preset values for CMOS, LVCMOS, ECL, TTL, LVTTL logic levels;

4.4 Voltmeter

Measurement channels: 2 channels;

DC voltage measurement range: 0～±500V;

AC voltage measurement range (50～60Hz (TRUE RMS, AC or AC+DC)): 0～500V;

Display resolution: 4½ Digits 20,000 Count;

4.5 Ammeter:

Measurement channels: 1 channel;

DC current measurement range: 0～±10A;

AC current measurement range (50～60Hz (TRUE RMS, AC or AC+DC)): 0～10A;

Display resolution: 4½ Digits 20,000 Count;

4.6 Ohmmeter:

Measurement channels: 1 channel;

Measurement range: 0～10MΩ;

Continuity: 0Ω～1kΩ, resolution: 100mΩ;

Diode: Measurement range: 0V～2V; resolution: 100μV; test current: 1mA;

Display resolution: 4½ Digits 20,000 Count;

4.7 Frequency Counter

Measurement channels: 1 dedicated channel + 3 DSO shared channels;

Frequency measurement range: Dedicated channel: 1MHz～800MHz; DSO channels: 2Hz～100MHz;

Input impedance: Dedicated channel: 50Ω; DSO channels: 1MΩ;

Voltage input range: Dedicated channel: ±3.3V; DSO channels: ±40mV～±8V.;

4.8 Auxiliary Power:

Voltage output: +5V, +3.3V, +12V, -12V;

Current limits: +5V/1A; +3.3V/1A, +12V/100mA, -12V/100mA;

5. Three-Dimensional Matrix V-I-F Dynamic Impedance Hybrid Circuit Test Module (3400 module *1)

5.1 Test channels: 4 probe channels, 4 synchronous pulse channels, 64 fixture test channels;

5.2 V-I curve scanning voltage range: 2～50Vp-p (2, 5, 10, 20, 50Vp-p);

5.3 V-I curve scanning frequency setting range: 1Hz～10kHz (can be set in 1Hz steps);

5.4 V-I curve test impedance range: 100Ω～1MΩ (100, 1k, 10k, 100k, 1MΩ);

5.5 Three-dimensional V-I-F curve scanning frequency range: 10Hz～10kHz (can be set in 1Hz steps);

5.6 Display curve modes: V-I, V-T, V-I-F, V-T-F;

5.7 Testing methods: storage comparison, probe real-time comparison, matrix testing;

5.8 Synchronous pulse output settings: single pulse, double pulse, triple pulse, quadruple pulse;

5.9 Synchronous pulse signal amplitude: -10V～+10V, minimum adjustment resolution 0.01V;

V. BM8600 Circuit Board Fault Detector System Main Advantages:

1. Modular Design: Can be freely expanded and arbitrarily split to meet the needs of different customers. Modular design allows the entire machine to be disassembled and combined into smaller instruments for use.

2. Software with Test Process Memory Function

ABI's BM-8600 adopts a novel testing concept. The design of the test process runs through the entire testing procedure, forming standardized test processes (maintenance process, production process, inspection process).

All steps and data of the process test can be saved according to testing requirements, forming a standardized test process.

Subsequent tests follow the standard process step by step, obtaining corresponding results and generating data comparison reports.

This ensures consistency in testing procedures, eliminating human factor interference. Semi-skilled engineers only need to follow instructions and diagrams step by step to operate the equipment and complete all inspection work. Making testing simple, easy, and standardized.

3. Concurrent Multiple Testing Operations on Circuit Boards and Integrated Circuits.

Including functional testing, V-I curve testing, temperature inflection point coefficient testing, connection status testing, pin voltage testing. Provides comprehensive test result information, greatly improving testing efficiency.

1) Multiple tests can be completed simultaneously, providing comprehensive information and saving testing time.

2) Test items: Integrated circuit functional testing, V-I curve measurement, curve inflection point temperature change coefficient, measurement of various pin voltage values, measurement and display of pin connection status.

4. Graphical Editing of Component Test Library and Full-Board Test Library

Using graphical programming, facilitates future expansion of component and circuit board libraries, enabling quick and easy establishment of component libraries not present in the test library.

Graphical component test library editing, input and output logic timing for each test channel can be graphically customized by the tester, facilitating quick and easy establishment of component libraries not present in the test library.

Full-board testing is very simple. Through the graphical test library editor, based on the circuit board schematic, define input stimulus signals and standard output response signals, quickly establish board test libraries, and rapidly batch test circuit board functions.

5. Capable of Testing Inflection Point Temperature Change Coefficient

V-I curve testing allows observation of the curve inflection point temperature change coefficient, making it easy to detect some non-fixed faults (or soft faults) in devices.

6. Short-Circuit Resistance Measurement Function

Short-circuit resistance measurement function:

Three-stage low resistance measurement range, can indicate resistance value size through image and sound changes, with automatic probe calibration function. This function can be used to check circuit board line resistance values, inspect short-circuit points, and determine line impedance and continuity.

7. Automatic Logic Level Threshold Scanning

Automatic logic level threshold scanning, determining board system logic level threshold critical values, setting cyclic tests to discover unstable errors.

1) Customizable logic level thresholds. Non-standard logic level thresholds can be set to check unstable components.

2) Logic level thresholds can be automatically scanned to determine board system logic level threshold critical values, setting cyclic tests to discover unstable errors.

Automatic logic level threshold scanning: Logic high and low levels are a range. This method determines the specific minimum level value that an integrated circuit can pass in the board system. This value can reflect the decline in the driving capability of the integrated circuit, facilitating the identification of devices with reduced driving capability.

8. Unique V-T Mode Can Measure Device Switching Time Characteristics (with synchronous pulse)

• The width of the synchronous pulse signal can be set for functional testing of thyristor components or FETs.

• During testing, the set square wave is synchronized to the test signal, allowing observation of differences in the switching time characteristics of three-terminal devices. The figure shows high-frequency state; problems with device switching time parameters are evident in the differences shown in the figure, which reflect switching time issues.

9. V-I Curve Matrix Testing

V-I testing is performed with each pin as a common terminal, enabling testing of impedance curves between pins to detect impedance differences, making the measurement information more comprehensive and accurate.

10. Discrete Device Functional Testing

1) Analog integrated circuit testing function: Capable of functional testing for analog amplifiers, comparators, diodes, transistors, thyristors, FETs, MOSFETs, optocouplers, AD/DA analog-to-digital conversion devices, and other analog integrated circuits.

2) Online measurement of analog device parameter values: Amplification factor (AV), CTR value (current transfer ratio), Vled (forward voltage of internal photodiode), Hfe value (current amplification factor of transistor), and other parameter values.

11. Unique Waveform Sleeve Design

12. Save waveforms as test steps (generate test database)

13. Variable frequency three-dimensional V-I-F measurement method, three-dimensional display of device port characteristic curves, enabling detection of frequency-related faults. Inspection of devices or circuit boards related to frequency characteristics.

14. Dynamic impedance analysis function, enabling measurement of voltage and current parameters on graphs.